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Next Generation Laser Diffraction Particle Size Analysis With the LS 13 320 XR
Improve your analysis with enhanced PIDS technology and extended measurement range
3 Apr 2018With an expanded measurement range of 10nm-3000um, and enhanced Polarization Intensity Differential Scattering (PIDS) technology, the LS 13 320 XR laser diffraction particle size analyzer by Beckman Coulter provides higher resolution and more precise measurement of particle size analysis. Furthermore, new software with an intuitive interface provides data you need with only a few clicks. This brochure provides you with detailed product specifications to enable you to make a more informed purchasing decision.
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Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.