ResourceMaterials

New Scanning Probe Techniques for Analyzing Organic Photovoltaic Materials and Devices

29 Jan 2015

Organic solar cells hold promise as an economical means of harvesting solar energy due to their ease of production and processing. This application note reviews the instrumental issues associated with the application of scanning probe microscopy techniques that have been shown to be useful in the study of nanostructured organic solar cells and opportunities for further improvements in scanning probe microscopy to contribute to OPV development.

MFP-3D-BIO™

Asylum Research

MFP-3D BIO - The Only Full-Capability AFM on an Inverted Optical Microscope. Uncompromised AFM on an Inverted Optical Platform. The Asylum Research MFP-3D-BIO provides the highest sensitivity and most accurate images and measurements possible on an inverted optical platform. The Best Force Measurements – from the Commercial Pioneer of Force Spectroscopy Asylum Research pioneered commercialization of picoNewton-scale force spectroscopy with its first product, the Molecular Force Probe (MFP). Asylum continues that leadership to this day with the MFP-3D. The NPS™ closed loop nanopositioning sensors on all three axes ensure distortion-free images on samples as small as proteins and as large as cells – in both air and liquid. The MFP-3D measures the cantilever deflection to better than 20pm (8pm typical) without artifacts, making the MFP-3D ideal for force measurements such as unfolding single molecules or probing cell mechanics.

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Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Solar EnergyEnergyRenewable EnergyPhotovoltaic Materials