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New Scanning Probe Techniques for Analyzing Organic Photovoltaic Materials and Devices
29 Jan 2015Organic solar cells hold promise as an economical means of harvesting solar energy due to their ease of production and processing. This application note reviews the instrumental issues associated with the application of scanning probe microscopy techniques that have been shown to be useful in the study of nanostructured organic solar cells and opportunities for further improvements in scanning probe microscopy to contribute to OPV development.
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Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Solar EnergyEnergyRenewable EnergyPhotovoltaic Materials
