ResourceLife Sciences
Nanoscale mapping of permittivity and conductivity with scanning microwave impedance microscopy
22 Jun 2023Scanning microwave impedance microscopy (sMIM) is an atomic force microscopy (AFM)-based technique for materials and device characterization. The reflected microwave signal from the tip-sample interface holds information of the electrodynamic properties of the sample surface underneath the tip apex. In this application note from Bruker, explore sMIM and its integration with Bruker’s versatile AFM platforms, such as the Dimension Icon® and Dimension Edge™ AFMs. Furthermore, discover how when combined with Bruker’s exclusive PeakForce Tapping® mode, it is possible to obtain sMIM results on delicate samples, such as carbon nanotubes.
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Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.AFM
