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Measuring nanoscale viscoelastic properties with AFM-based nanoscale DMA

Bruker Nano Surfaces and Metrology
22 Jun 2023

The development of heterogeneous materials like polymer composites, blends, and multilayers is of considerable importance in the chemicals industry. Bulk viscoelastic measurements are routine in establishing structure-property relationships for these materials. In this application note from Bruker, explore how the development of the AFM-nDMA™ mode, can avoid issues associated with measuring nanoscale viscoelastic properties and how the frequency and temperature dependence of viscoelastic properties in rheologically relevant ranges can be directly measured with 10 nm spatial resolution.

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Bruker Nano Surfaces and Metrology

Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. 

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Bruker Nano Surfaces and Metrology

World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.Dimension FastScan™ Features: Work hundreds of times faster with fast scanning rates up to frames per second, automated laser and detector alignment, comprehensive work flow and smart engaging Built-in measurement automation software in conjunction with higher speed ScanAsyst® provide exceptional measurement confidence and repeatability Precise force control at the tip renders high resolution and long tip-life Low-noise, temperature-compensated sensors in the scanners maintain sub-nanometer noise levels Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift Sample from subnanometer to hundreds of nanometers in height without loss of resolution

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.AFMNanomaterialsNanomaterials such as carbon nanotubes, fullerenes and nanoparticles are a group of materials that measure between 1-1000nm for a single unit. Analysis techniques include AFM, electron microscopy and super resolution microscopy.

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Measuring nanoscale viscoelastic properties with AFM-based nanoscale DMA