Large Area Imaging with High Throughput

23 Jan 2018

This application note describes the automated acquisition of multi-image mosaics at multiple sample sites for electron microscopy, detailing the various sample collection capabilities.

ZEISS Atlas 5

ZEISS Research Microscopy Solutions

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create large image montages, automatically moving from image tile to tile, and mosaic site to site, resulting in an “Extreme Field of View” image, at SEM nanometer scale resolution. ATLAS provides • reduced number of tiles to acquire, reducing stage motion delay and areal fraction of each image “lost” to overlap • reduced number of overlap “seams”, leading to less beam damage and degradation of the sample • reduced computational complexity

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Large Area Imaging with High Throughput