ResourceSpectroscopy
Investigation of the Formation and Structure of APTES Films on Silicon Substrates
3 Feb 2014In this study, APTES films are produced in two different solutions, anhydrous toluene and phosphate buffered water, for varied deposition times. The effect of the reaction solution and deposition time on the structure of APTES films is investigated via Fourier transform infrared spectroscopy (FTIR) with a grazing–angle attenuated total reflection method and ellipsometry.
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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Silicon