ResourceMaterials

Investigating structure-property relationships in a carbon-fiber composite

19 Jun 2024

Characterizing composite materials is a challenging task. Understanding the nucleation processes is critical toward engineering against failure, but traditional bulk testing methods are insufficient to describe this process. ZEISS presents how correlative microscopy is a viable conduit into the digital material testing approach. A carbon fiber reinforced composite hockey stick was used as the subject of the characterization study, though this same technique can apply to any variety of materials, from glass composites to metal matrix composites, as well as to monolithic materials. Correlative microscopy enabled a robust imaging-to-simulation workflow, producing a model that is available for further digital modification and analysis. Through implementation of this procedure in a regular basis, material development efficiencies may be enhanced, leading to high-performance products in a reduced amount of time.

ZEISS Atlas 5

ZEISS Research Microscopy Solutions

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create large image montages, automatically moving from image tile to tile, and mosaic site to site, resulting in an “Extreme Field of View” image, at SEM nanometer scale resolution. ATLAS provides • reduced number of tiles to acquire, reducing stage motion delay and areal fraction of each image “lost” to overlap • reduced number of overlap “seams”, leading to less beam damage and degradation of the sample • reduced computational complexity

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Correlative MicroscopyCarbon fiberAnisotropicComposites