ResourceLife Sciences
Improving High-Resolution Imaging of Non-Conductive Specimens with Local Charge Compensation
22 Jul 2018High-resolution combined with an additional expansion of analytical capabilities is extremely important for many applications in material analysis. With the integration of a charge compensation system, these investigations are not restricted to conductive samples only but can also be executed for all kinds of non-conductive samples. Such a method is demonstrated here in the application note below.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.High Content ImagingHigh content imaging is a method combining two or more fluorescent microscopy experiments to identify substances that alter a cell’s phenotype in a desired manner. The process is adapted to multi-well plates and both the image acquisition and analysis are automated.Super Resolution MicroscopySEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

