ResourceForensics
Improved Gun Shot Residual Analysis
18 Nov 2014Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) are well established techniques for the classification of gunshot residue (GSR) in forensic examinations. However, they are often not sufficient to clearly distinguish between GSR and environmental particles. In this application note discover how combining SEM and EDS with focused ion beam and electron backscatter diffraction analysis can provide more accurate and reliable GSR characterization.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Environmental Forensics