ResourceMaterials
Identify, access, prepare and analyze with precise navigational guidance
26 Sept 2023Advanced materials research is challenging, as material scientists need to understand structures, properties and processes across different length scales within a material. This requires a range of imaging and analysis technologies that enable them to understand materials from macro-to-sub-nanometer scales. Following the move from the macro-scale to sub-nanometer, a workflow that enables scientists to make the best decisions possible for the best experimental outcomes is needed.
In this application note, ZEISS details its Sample-in-Volume Analysis workflow that aims to provide navigational guidance to characterize samples within a large volume in order to present multi-scale and multi-modality experimental findings.
Links
Tags
Mechanical TestingMechanical testing explores the elastic and inelastic nature of a material when force is applied. A mechanical test shows whether a material is suitable for its intended application by measuring hardness, tensile strength, elongation, elasticity, and fatigue limit.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.NanostructuresNanomaterialsNanomaterials such as carbon nanotubes, fullerenes and nanoparticles are a group of materials that measure between 1-1000nm for a single unit. Analysis techniques include AFM, electron microscopy and super resolution microscopy.