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High Resolution STEM and EDS FIB-SEM Study of Chromium Depletion in Stainless Steel

ZEISS Research Microscopy Solutions

High Resolution STEM and EDS FIB-SEM Study of Chromium Depletion in Stainless Steel

16 Mar 2016

This application note describes a study of heat affected X2CrNi18-10 stainless steel. Small chromium carbide particles form at the grain boundaries of the material, causing chromium depletion of the surrounding matrix and thus promoting corrosion. A thin lamella was prepared at a grain boundary and analyzed with scanning transmission electron microscopy (STEM) and energy dispersive spectroscopy (EDS) by a ZEISS FIB-SEM instrument. The EDS results obtained on the lamella show a spatial resolution of the order of 10 nm and allow the extent of the chromium depletion to be qualitatively determined.

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Surface Area TestingPhysisorption studies fundamental parameters essential for the characterization of materials such as the specific surface area and pore size distribution. Properties such as porosity, strength, hardness, permeability, separation selectivity, corrosion, and thermal stress resistance can all be directly correlated to the porous structure of a material.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.CorrosionMetalsMetal analysis is critical in various industries, including environmental monitoring, food safety, and pharmaceuticals. Techniques such as ICP-MS and atomic absorption spectrometry are commonly used to detect trace metals. Explore metal analysis tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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High Resolution STEM and EDS FIB-SEM Study of Chromium Depletion in Stainless Steel