Fabrication and characterization of nanofluidic devices for DNA optical mapping

25 Feb 2021

Nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were fabricated and characterized using FIB-SEM. Direct FIB nanopatterning of silicon master stamps allows fast prototyping of nanochannels of different shapes, cross sections and depths.

In this application note, ZEISS demonstrates how the Crossbeam can be an extremely useful tool for research in the field of nanofluidics and single molecule detection.

ZEISS Crossbeam Family

ZEISS Research Microscopy Solutions

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber size, standard or large, that best suits your samples.

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.NanofabricationSEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
Fabrication and characterization of nanofluidic devices for DNA optical mapping