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Ellipsometric Characterization of Doped and Undoped Crystalline Diamond Structures

HORIBA Scientific
4 Mar 2013

Diamond is an attractive material for various fields of technology. In addition to reviewing some of the potential applications of diamond, this note, demonstrates how spectroscopic ellipsometry can be used to characterize the optical and structural properties of doped and undoped diamond layers.

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Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Diamond

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Ellipsometric Characterization of Doped and Undoped Crystalline Diamond Structures