ResourceSpectroscopy

Determination of Impurities in Organic Solvents used in the Semiconductor Industry with the NexION

1 Aug 2012

300S ICP-MSThis application note demonstrates the ability of the NexION 300S ICP-MS to remove interferences so that trace levels of impurities in IPA and PGMEA can be easily measured using hot plasma conditions for all analytes in a single analysis. This was best accomplished using both Standard and Reaction modes in a single method.

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Mass SpectrometryMass spectrometry (MS) is a powerful analytical technique used to identify and quantify molecules based on the mass-to-charge ratio of gas-phase ions. It provides detailed information about the structure, composition, and properties of compounds and is widely used across fields such as environmental monitoring, materials science, drug discovery and development, food and beverage testing, and wider chemical research. Key MS techniques include tandem mass spectrometry (MS/MS), liquid chromatography–mass spectrometry (LS-MS) and inductively coupled plasma (ICP-MS). Choosing from these wide range of techniques and technologies can be a daunting task, so keep up to date with scientific applications, performance expectations, and customer reviews here all in one place. Visit our product directory to receive quotes direct from the manufacturer. Contamination PreventionContamination prevention aims to control and minimize the risk of contamination during experiments. Biological safety cabinets and sterilization equipment are examples of technologies used to prevent contamination.Semiconductors
Determination of Impurities in Organic Solvents used in the Semiconductor Industry with the NexION