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Cross Sectioning of CuSn Connector of a Solar cell
30 Jan 2015This application note demonstrates the use of the Leica EM TIC3X to view a cross section of a CuSn connector of a solar cell to see the layer structure and their interfaces. Ion beam slope cutting is a method suitable for creating flat cross sections of soft materials such as the CuSn connector.
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EM TIC 3X Ion Beam Milling System
Leica Microsystems EuropeThe Triple Ion Beam Cutter, EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Solar EnergyEnergyRenewable Energy