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Characterizing polymers using correlative RISE microscopy
19 Jun 2024Many polymers are challenging to understand because of their complex structures. Traditional characterization methods often imply time-consuming sample preparation and are limited in terms of revealing fine structural details. ZEISS presents an optimal solution for characterizing polymers and illustrates how correlative Raman imaging scanning electron microscopy (RISE) can be used to analyze aging of battery separators, identify polymers in blends, and improve the quality of paper. It shows how the RISE integrated system provides a user-friendly correlative workflow and offers the capability to do analysis beyond energy-dispersive X-ray spectroscopy (EDS) via vibrational spectroscopy, while being fully integrated into an SEM.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.PolymersPolymers are large molecules made up of many repeat units. Natural polymers such as DNA and proteins are essential to life, whereas synthetic polymers such as polystyrene and polyethylene are used widely due to their functionality. Typical techniques for analysis include GPC, SEC, DSC, FT-IR and NMR.RamanCorrelative MicroscopyRISE