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Characterization of Solid Oxide Electrolysis Cells by Advanced FIB-SEM Tomography

6 Jun 2019

Microstructural changes after cycling of a solid oxide electrolysis cell (SOEC) were studied by means of FIB-SEM tomography. The advanced tomography package ZEISS Atlas 5 3D Tomography allows high resolution 3D electron imaging and 3D EDS elemental imaging using two different sets of SEM conditions optimized for the respective task. The additional chemical information facilitated the correct segmentation of the different phases present in the sample. This was crucial to better understand the diverse mechanisms leading to deterioration of the cell.

ZEISS Atlas 5

ZEISS Research Microscopy Solutions

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create large image montages, automatically moving from image tile to tile, and mosaic site to site, resulting in an “Extreme Field of View” image, at SEM nanometer scale resolution. ATLAS provides • reduced number of tiles to acquire, reducing stage motion delay and areal fraction of each image “lost” to overlap • reduced number of overlap “seams”, leading to less beam damage and degradation of the sample • reduced computational complexity

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
Characterization of Solid Oxide Electrolysis Cells by Advanced FIB-SEM Tomography