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Characterization of Monolayer Segregation Using ZEISS MERLIN
3 Jan 2018Electron probe micro analysis (EPMA) is a useful alternative to Auger electron spectroscopy for surface analysis as it does not require any in situ preparation and is not strongly sensitive to surface contamination. In this application note, the ZEISS MERLIN FE-SEM is demonstrated as a versatile imaging instrument for detecting trace elements at the parts per million (ppm) level.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.