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Beryllium Analysis in Beryllium Copper Alloy

Rigaku Corporation
28 Nov 2012

The characteristics and uses of beryllium copper alloys depend on beryllium concentration, thus it is important to analyze beryllium in beryllium copper. This application note demonstrates that beryllium in beryllium copper alloy can be routinely analyzed using the ZSX Primusll from Rigaku. The ZSX PrimusII, a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, was equipped with a 4 kW X-ray tube with a Rh target, featuring a ultra-thin beryllium window, and four analyzing crystals covering F to U. In this analysis, the multi-layer analyzer, RX75 (optional) was also mounted in the spectrometer.

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ZSX Primus II

Rigaku Corporation

Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered.ZSX Primus II Features Analysis of elements from Be to U Tube above optics minimizes contamination issues Small footprint uses less valuable lab space Micro analysis to analyze samples as small as 500 µm 30μ tube delivers superior light element performance Mapping feature for elemental topography/distribution Helium seal means the optics are always under vacuum

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Mass SpectrometryMass spectrometry (MS) is a powerful analytical technique used to identify and quantify molecules based on the mass-to-charge ratio of gas-phase ions. It provides detailed information about the structure, composition, and properties of compounds and is widely used across fields such as environmental monitoring, materials science, drug discovery and development, food and beverage testing, and wider chemical research. Key MS techniques include tandem mass spectrometry (MS/MS), liquid chromatography–mass spectrometry (LS-MS) and inductively coupled plasma (ICP-MS). Choosing from these wide range of techniques and technologies can be a daunting task, so keep up to date with scientific applications, performance expectations, and customer reviews here all in one place. Visit our product directory to receive quotes direct from the manufacturer. X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.MetalsMetal analysis is critical in various industries, including environmental monitoring, food safety, and pharmaceuticals. Techniques such as ICP-MS and atomic absorption spectrometry are commonly used to detect trace metals. Explore metal analysis tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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Beryllium Analysis in Beryllium Copper Alloy