ResourceLife Sciences
Beam Deceleration Imaging with ZEISS EVO Beam
8 Nov 2017EVO conventional scanning electron microscope has a new sample bias module that enables beam deceleration imaging. This, combined with the ZEISS HD BSE detector, produces high quality images with enhanced surface contrast and topographical detail.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.ImagingImaging techniques are essential for obtaining visual representations of samples to understand structures, processes, and function in biological, chemical, and physical research. These tools range from traditional light microscopy to advanced imaging modalities like MRI and electron microscopy, providing researchers with valuable data for diagnostics, drug discovery, and material analysis. Explore imaging solutions in our peer-reviewed product directory to compare products, check reviews, and get pricing directly from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.