ResourceSpectroscopy
Automated Ultra-Trace Analysis using the contrAA® Dynamic Mode
9 Dec 2016This technical note details some of the key benefits featured in the contrAA® Dynamic Mode. For ultra-trace analysis the contrAA® yields detection limits up to an order of magnitude better than traditional AAS technology. The contrAA® 800 series Dynamic Mode automates many key operations, enabling the connection of multiple calibration curves to provide a wide-range calibration over up to five orders of magnitude. This allows measurements of ultra-trace- and major elements in the same sample with a single method, thus offering a dynamic range similar to that of ICP-OES instruments.
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Atomic Absorption / Emission SpectroscopyAtomic absorption spectroscopy (AAS) and atomic emission spectroscopy (AES) — also called optical emission spectroscopy (OES) — are used to detect the elemental constituents in samples. Both techniques involve the atomization of a sample. Atomic absorption spectrometers may use a flame or furnace to create an atomic vapor of the sample before irradiation with spectral light. Optical emission spectrometers may use a flame, inductively coupled plasma (ICP), microwave plasma (MP) or spark arcs to atomize and excite the sample. At higher excitation energies, electrons can be emitted instead of photons, which can be useful for samples that can’t be atomized and for surface analysis. Explore electron spectroscopy equipment such as Auger spectrometers and photoelectron spectrometers for surface elemental analysis of samples. Find the best atomic absorption, photoelectron and optical emission spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
