ResourceSpectroscopy
Angle Resolved XPS for the Characterization of Self Assembled Monolayers
4 Mar 2013Self assembled monolayers (SAMS) are increasingly important as a means to functionalize surfaces to control surface properties or reactivity. In this application note the Thermo Scientific Theta Probe was used to characterize self assembled monolayers on a gold surface with ARXPS. It was possible to determine the attachment scheme of the layers, the thickness of these layers and the way in which the concentration of material or chemical states varies within the top few nanometers of the material.
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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Surface Mapping