ResourceSpectroscopy
Analysis of Clinker and Cement with Thermo Scientific ARL OPTIM’X WDXRF Sequential Spectrometer
28 Jul 2013This application note shows that the Thermo Scientific™ ARL™ OPTIM’X WDXRF instrument permits successful analysis of various elements in cement and clinker in less than two minutes at 200 W.
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Thermo Scientific™ ARL™ OPTIM'X WDXRF Spectrometer
Thermo Fisher ScientificMeet materials analysis requirements with qualitative and quantitative characterization of all types of conductive and non-conductive unknown samples. The system is available in packages suited for analysis in petroleum, cement, and slags industries or for multi-purpose requirements in analytical laboratories.
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Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Cement