Advanced FIB-SEM tomography for characterizing solid oxide electrolysis cells

This application note from ZEISS details how advanced FIB-SEM tomography was used to study microstructural changes in a solid oxide electrolysis cell (SOEC) after cycling. The ZEISS Atlas 5 3D Tomography package allowed for high-resolution 3D electron imaging and 3D energy dispersive spectroscopy (EDS) elemental imaging using optimized scanning electron microscope (SEM) conditions.The additional chemical information provided facilitated correct segmentation of different phases, crucial for better understanding the mechanisms leading to cell deterioration. The 3D FIB-SEM/EDS capability enabled the measurement of metric and topological properties, and directed discrete-element simulations to quantify the extent of microstructural changes and their detrimental effect on cell performance.