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A case study of sparse-particle analysis in a bulk material

25 Sept 2023

This application note from ZEISS describes a case study of a correlative workflow that combines submicron-resolution 3D X-ray microscopy and focused ion beam scanning electron microscope (FIB-SEM) with an integrated femtosecond laser for streamlined, precise analysis and results available the same day. In the note, ZEISS details how two isolated particles buried within a small iron plate were characterized, and how the workflow can be applied to a variety of applications from life science to semiconductors.

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.3D Imaging3D imaging technologies allow for the visualization and analysis of three-dimensional structures at high resolution. These systems are used in fields like molecular biology, material science, and medical diagnostics. 3D imaging can be applied to visualize cells, tissues, and organs, providing valuable insights into their structure and function. Browse our peer-reviewed product directory to find the best 3D imaging solutions, compare products, check reviews, and get pricing directly from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
A case study of sparse-particle analysis in a bulk material