Electron Microscopy > Scanning Transmission Electron Microscopes (STEM) Products & Reviews

Inlens FE-SEM and STEM

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

Multipurpose Analytical S/TEM

Atomic Resolution S/TEM

200kV Monochromated S/TEM

Atomic Resolution TEM

High-throughput Analytical S/TEM

High resolution TEM and STEM microscope for all materials science and semiconductor applications.

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

in situ Transmission Electron Microscope