Non-Destructive Techniques > Ellipsometry Products & Reviews

Imaging spectroscopic ellipsometer for spatially resolved thin film analysis

Imaging ellipsometer for precise thin film and surface characterization

The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation. Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities. The Auto SE is a highly featured instrument that includes an automatic XYZ stage, r…

Key Features Benefits Multiple LED sources: Blue (465nm), Green (525nm), Yellow (580nm), and Red (635nm) Long lifetimes (>50,000 hours), with no costly lamp changes, time consuming alignments or PM procedures No moving parts in the ellipsometric detector Fast measurement times (multi-wav…

Spectroscopic and Single-Wavelength Ellipsometry. Optically flat surfaces are essential. The sensitivity is usually shot noise limited, and typically is equivalent to an ellipticity of about 10?5, or to a polarisation angle of 10?³ degrees at a time constant of 1 sec.

FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ellipsometer is ideally suited for use in academic and R&D settings investigating the thickness and uniformity of ultra-thin films.