Electron Microscopy > Scanning Electron Microscopes (SEM) Products & Reviews

Ultra-versatile high-resolution SEM with unique environmental capability

Field Emission EPMA

LaB6 EPMA

Field Emission Auger Microprobe

Large area image acquisition

This device is dedicated to precious metal thin film coating for SEM observation.

Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

Component cleanliness analysis with a multi-purpose desktop SEM.

SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.

Scanning nitrogen-vacancy magnetometry

Desktop SEM for robust and effortless SEM analysis, expanding your research capability.

Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.

Economical desktop SEM with advanced, easy to use features.

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization.

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

Cutting Edge in FIB sample preparation, imaging and analysis

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact design. Its main body is only 55cm wide, and unlike conventional SEM design concepts the SU1510 does not require a special display and operating console - instead, monitor and PC controls can be conveniently placed on any user prepared workspac…