Materials Products & Reviews

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand for robust, affordable SEM application solutions. Image performance in this series is optimized with the latest generation of Hitachi's patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control; affording u…

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with consideration of the total system performance. This results in exceptional stability, milling performance and resolution, allowing e.g. automated mill-and-monitor operations for 3D reconstructions with slicing steps down to 5nm. NB5000 incorporate…

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

Inductively Coupled Plasma Mass Spectrometer (ICP-MS) The Science of sensitivity Bruker's ICP-MS is famous for its innovative and unique technology and has now been further refined to meet the ever increasing demands of latest application and laboratory requirements. Bruker's aurora M90 continues to be the workhorse for the routine laboratory, now with additional and improved characteristics. In addition to the aurora M90, Bru…

The Triple Ion Beam Cutter, EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. 

Ensure the ultrastructures of your tissue samples can be precisely compared every time by preparing them with the EM TP tissue processor. 

High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…

Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…

Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…

High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…

Disposable cuvettes for spectrophotometry, optical PS visible range cuvettes, UV Grade PMMA cuvettes. Standard and semi-micro disposable cuvettes for spectroscopy made of optical PS and PMMA UV grade optical windows to achieve optimal transmittance through spectral range from 340 to 800 nm (OPS) an from 280 to 800 nm (PMMA UV qrade). The engineering and quality control determine the reproducibility of the cuvettes. These are s…

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The i…

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline structures which affect physical properties in a wide range of materials. As an integral part of the Thermo Scientific NORAN System 7, simultaneous acquisition of EBSD and EDS/WDS spectral images are performed with ease.

High-Precision Thermometer- Maximum accuracy at an unrivaled price. The high-precision thermometer from Anton Paar is designed for the most accurate temperature measurements, comparison calibrations and fixed point calibrations in industry, laboratories and research. Combined with calibrated platinum resistance thermometers, Anton Paar's thermometer achieves a measuring uncertainty of 1 mK to 10 mK.…

Modular laser diffraction sensor for laboratory analysis of particle size and distribution from below 0.1 µm to 8,750 µm

Research Raman made easy!

Modular dynamic image analysis sensor for laboratory particle size and shape characterization from below 1 µm to 34,000 µm

Dynamic light scattering based on the unique PCCS-technique for size and stability analysis of opaque nano-suspensions and emulsions from 0.5 nm to 10,000 nm

Ultrasonic extinction sensor for particle size and concentration analysis in highly concentrated suspensions and emulsions for process or laboratory applications from below 0.1 µm to 3,000 µm

Laser diffraction sensor for process particle size and distribution analysis of fine, even cohesive powders from 0.25 μm to 3,500 μm

MicroXCT-200 - High Resolution and Contrast; Large Sample Size and Shape Flexibility; Automated Multiple Point Imaging. The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples. Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials. The MicroXCT-200 provides t…

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