Physical Electronics Products & Reviews

PHI nanoTOF TOF-SIMS The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented TRIFT analyzer. Several significant improvements have been introduced with the nanoTOF. The superior performance TRIFT analyzer has been combined with a revolutionary new sample handling platform. This innovative new sample handling platform was…