Multi-Wavelength Ellipsometers for Thin Film Measurements Innovative The Film Sense FS‑1™ Multi-Wavelength Ellipsometer uses long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system. Powerful The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples. Affordable The FS‑1 offers the power of Multi-Wavelength Ellipsometry, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. The FS‑1 is ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.
Key Features Benefits Multiple LED sources: Blue (465nm), Green (525nm), Yellow (580nm), and Red (635nm) Long lifetimes (>50,000 hours), with no costly lamp changes, time consuming alignments or PM procedures No moving parts in the ellipsometric detector Fast measurement times (multi-wav…
