ZEISS Presents World’s Fastest Scanning Electron Microscope: Highest Speed for Brain Research with ZEISS MultiSEM 505

At the annual Neuroscience meeting in Washington, D.C., November 15-19, 2014, ZEISS will present ZEISS MultiSEM 505, its new scanning electron microscope (SEM). As the first SEM in the world, the system features 61 beams working in parallel, and offers an unrivaled capture speed of 1220 megapixels per second at a pixel size of 4 nm. This high acquisition speed is used for imaging neural tissue in brain research where it is now possible to observe much bigger samples than before. ZEISS MultiSEM 505 is designed for continual operation and fitted with the intuitive ZEN Software.

Conventional SEMs use a single electron beam, which is guided over the sample surface and by acquiring pixel by pixel an image of the sample is formed. ZEISS MultiSEM uses 61 beams simultaneously, making it possible to acquire 61 images in parallel. Thus large areas can now be imaged very quickly and acquisition times are reduced from years to weeks.

The first users of ZEISS MultiSEM 505 are the laboratories of Jeffrey Lichtman, Harvard University in Cambridge, USA, and Winfried Denk, Max Planck Institute of Neurobiology in Martinsried, Germany. Both are using microscopy to investigate structure and function of the brain. Their results will help to better understand the causes of illnesses such as Alzheimer’s and Parkinson’s, and develop corresponding treatments.