ZEISS FIB-SEM and Correlative Workflows Showcased at IMC 2014

ZEISS demonstrates its FIB-SEM Crossbeam and showcases the new correlative workflow environment at IMC 2014 in Prague, Czech Republic, September 07- 12.

Crossbeam increases throughput using a high current ion beam of up to 100 nA. While milling the samples at unprecedented precision at all currents, users can acquire images and analytical data simultaneously in up to 4 channels at the same time. This FIB-SEM has the ability to image extreme fields of view of several 10s of microns at nanometer resolution thanks to the GEMINI technology and the Atlas 3D package.

Crossbeam ties in seamlessly into the new correlative microscopy environment that links ZEISS microscopy tools. This correlative software workspace enables fusion of data across multiple imaging modalities, length-scales, and dimensions. It is based upon the Atlas software solution layer that can operate across multiple instruments, allowing data from the same sample to be acquired, aggregated, and analyzed in a single correlative workspace. The preview at IMC will demonstrate Atlas’ unique capabilities to seamlessly link different microscope technologies for comprehensive materials characterization. As part of this, a ZEISS Xradia Versa X-ray microscope will also be available for virtual demonstrations, highlighting its non-destructive, high-contrast and high-resolution 3D imaging.