Ultraviolet, 1-300 nm Soft X-ray Spectrometer

8 Jan 2007

Product news

The McPherson Inc. Model 248/310 is an important tool for scientists developing new pulsed and tunable x-ray laser sources.

Detect laser harmonics over a wide 4eV to 1.2keV energy range. Charge coupled detectors (CCD) or alternately, gated microchannel plate (MCP) intensifiers, are preferred detection schemes. Tune the wavelength centered on the detector from ~1 to 300nm. The dispersion and range intercepted across the CCD or MCP corresponds to the diffraction grating selected for use. The 248/310 features clean stainless steel construction and compact design that also lends it well to work with a variety of laboratory discharge light sources and detectors, ideal for astrophysics calibration work.

The McPherson Inc. Model 248/310G is suitable for work in the 10-6 torr vacuum range. An ultra high vacuum (UHV) version, suitable for work in the 10-10 torr vacuum range, is also available. An good assortment of diffraction gratings is available to match the experimental region of interest. The 248/310 complements the McPherson line of vacuum capable spectrometers suitable for lower energies and longer wavelengths. It uniquely bridges the gap between diffraction grating instruments and dedicated x-ray instrumentation.

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UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Ultraviolet, 1-300 nm Soft X-ray Spectrometer