Thermo Showcases its New Materials Characterization Instrument at AVS International Symposium 2006

10 Oct 2006

Product news

Thermo Electron Corporation, world leader in analytical instrumentation, will be exhibiting its new K-Alpha Materials Characterization instrument on booth #1529 at the 53rd International Symposium and Exhibition of the American Vacuum Society (AVS) at the Moscone West Convention Center, San Francisco, CA, 12 -17 November 2006.

Using X-ray Photoelectron Spectroscopy (XPS), the K-Alpha enables rapid, accurate and cost-effective quantitative monitoring of the surface chemical composition of the top few nanometers of solid materials including insulators, semiconductors and metals.

Thermo will be holding live demonstrations of its new XPS instrument at the show, allowing scientists involved in high throughput analyses of traditional materials as well as emerging biotech, nanotech and pharmaceutical industries to view analyses of samples relevant to their particular area of interest. Free registration to the limited demonstrations slots is available via the article webpage.

The K-Alpha features new electron optics delivering high sensitivity, permitting insight into the most complex surface chemistries. Incorporating ingenious data processing algorithms, the system offers full automation from sample acquisition to data interpretation and reporting. An integral ion source achieves high-resolution depth profiling, thus facilitating true three-dimensional analysis. Furthermore, the K-Alpha is equipped with a built-in calibration system while the instrument’s intuitive operation means that it is well suited to both routine and research applications. Featuring a compact instrument footprint, the K-Alpha saves valuable laboratory space while the instrument’s low cost of ownership makes it much more attainable than other XPS instruments available on the market.

The AVS International Symposium and Exhibition addresses cutting-edge issues associated with vacuum science and related technologies in both the research and manufacturing communities. Each year, over 200 companies and more than 3,000 scientists and engineers gather from around the world to attend the show, which features papers from technical divisions and technology groups, topical conferences on emerging technologies and short courses providing specialized training in specific areas of vacuum science and related technologies.

For more information about Thermo’s novel K-Alpha XPS instrument, please visit booth #1529 at AVS International Symposium and Exhibition 2006 in San Francisco.

Tags

X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Thermo Showcases its New Materials Characterization Instrument at AVS International Symposium 2006