Thermo Fisher Scientific Announces an Agreement to Distribute Edax’s EBSD Systems

16 Sept 2007
Greg Smith
Analyst / Analytical Chemist

Product news

Thermo Fisher Scientific Inc., the world leader in serving science, today announced that it has signed an agreement with Edax, a business unit of the Ametek Materials Analysis Division, to distribute its Electron Backscatter Diffraction (EBSD) Systems. Featuring Edax’s advanced Orientation Imaging Microscopy technology (OIM™), the EBSD system will add unique capabilities to Thermo Fisher’s existing world class microanalysis offering.

OIM is an advanced EBSD system available for analyzing crystal orientations in a sample. Featuring an EBSD detector, OIM analysis and data collection software, the system provides a sophisticated combination of speed, accuracy and flexibility. The rapid data acquisition rates make it a very effective analytical method for research and production environments. Determining the structural properties of the material under analysis in the electron microscopes aids in failure analysis and enables researchers to improve their processes and products.

“OIM is the perfect complement to the NORAN SYSTEM SIX advanced X-ray microanalysis system,” comments David Rohde, X-ray microanalysis product manager, Thermo Fisher Scientific. “By offering both the NORAN SYSTEM SIX and EBSD, Thermo Fisher enables scientists to determine both the elemental and structural composition of a variety of materials.”

“Edax is pleased to provide Thermo Scientific users with the opportunity to extend their analytical capabilities to include structural analysis with the market-leading OIM EBSD system,” said Del Redfern, Edax’s product marketing manager.

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Thermo Fisher Scientific Announces an Agreement to Distribute Edax’s EBSD Systems