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The NEW Q-Scope White Light Interferometer/SPM

LOT Oriel Group
23 Dec 2009
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Consultant

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Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform. With the addition of interferometric technology to the Q-Scope SPM, Ambios is enabling the research community of AFM users. How many SPM users wish they could just take a quick large area scan to characterize their sample surface?

Q-View interferometer mode can take a 500 micron scan with nanometer resolution in a few seconds; switch to SPM mode and they can zoom in on the area of interest and image and measure in the sub-angstrom level. The interferometer mode and SPM mode both run off a new version of ScanAtomic software in real time and Q-Port Image rendering software, so the user can run two technologies on one instrument by switching from AFM Scan Head to Q-View Interferometer module. There are many great new features including multi scan stitching which can stitch together multiple images in SPM or interferometer mode, Motorized Z-stage with auto focus, and much much more.

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InterferometryInterferometry is an investigative technique used to analyze the pattern of interference created during the superposition of 2 or more waves. An interferometer is used to produce 2 or more overlapping waves. The interferometer is comprised of 2 or more telescopes, a detector and a correlator. The interferometer detector may utilize homodyne or heterodyne detection of the interference pattern.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Nanometer ResolutionImage RenderingMulti Scan Stitching

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The NEW Q-Scope White Light Interferometer/SPM