NewsSpectroscopy
Spectroscopic Ellipsometer: Did you measure all of the Data?
9 Feb 2006Product news
HORIBA Jobin Yvon introduces the MM16 Mueller Matrix spectroscopic ellipsometer to its product line of ellipsometric tools for advanced characterization of a broad range of materials and thin films for compounds, alloys, semiconductors, and organics.
The MM16 is exemplified by fast measurements, with no mechanical movements, of the Mueller matrix and determines the optical constants, thickness, surface characteristics, stoichiometry, compositional uniformity, crystallinity, and anisotropy/birefringence. With data acquisition times from 2 seconds, small form factor, and optional components for both ex-situ and in-situ configurations, the MM16 is now the most cost effective spectroscopic ellipsometer available for material analysis.
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UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.