SPECTRO Analytical UK to Exhibit New SPECTROBLUE TI at Lab Innovations 2013

14 Aug 2013
Sarah Thomas
Associate Editor

Product news

SPECTRO Analytical UK will showcase the new SPECTROBLUE TI inductively coupled plasma optical emission spectrometer (ICP-OES) at Lab Innovations 2013 (6 - 7 November 2013, National Exhibition Centre, Birmingham, UK).

This innovative system extends the company’s SPECTROBLUE ICP-OES product line, offering automatic dual plasma observation. This optimizes linearity and dynamic range, while enabling high-sensitivity measurement of toxic elements, which makes it especially suitable for environmental analyses. While matrix effects are drastically reduced, it can accurately determine levels of alkali/earth alkali elements in complex alkali matrices.

Also new this year, the portable SPECTROSCOUT energy-dispersive XRF analyser will be on the stand demonstrating its ability to achieve rapid, laboratory-class elemental analysis of environmental and geological samples even in remote locations. In addition, SPECTRO will be showcasing the SPECTRO XEPOS, a versatile X-ray fluorescence spectrometer with high sensitivity for light, medium and heavy elements.

“We are delighted to be part of Lab Innovations in 2013,” said Steve Allott, Manager of SPECTRO UK & Ireland. “SPECTRO aims to provide industry-orientated solutions through quality products that both improve safety and offer superior analytical elemental analysis. By demonstrating our equipment to both existing and potential customers, we hope to be able to make a real difference to companies’ day to day applications and testing.“

Visitors to Lab Innovations can find SPECTRO UK on stand number A23.

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Atomic Absorption / Emission SpectroscopyAtomic absorption spectroscopy (AAS) and atomic emission spectroscopy (AES) — also called optical emission spectroscopy (OES) — are used to detect the elemental constituents in samples. Both techniques involve the atomization of a sample. Atomic absorption spectrometers may use a flame or furnace to create an atomic vapor of the sample before irradiation with spectral light. Optical emission spectrometers may use a flame, inductively coupled plasma (ICP), microwave plasma (MP) or spark arcs to atomize and excite the sample. At higher excitation energies, electrons can be emitted instead of photons, which can be useful for samples that can’t be atomized and for surface analysis. Explore electron spectroscopy equipment such as Auger spectrometers and photoelectron spectrometers for surface elemental analysis of samples. Find the best atomic absorption, photoelectron and optical emission spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Elemental AnalysisElemental analysis involves determining the elemental composition of a sample, often used in environmental, pharmaceutical, and material sciences. Techniques like ICP-MS, X-ray fluorescence, and atomic absorption spectroscopy allow precise quantification of elements such as metals and nonmetals in complex matrices. Browse our peer-reviewed product directory to find the best elemental analysis tools, compare products, check reviews, and get pricing directly from manufacturers.