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SLICE: A New XRF Methodology and Library for Sample Identification and Archiving

HORIBA Scientific
17 Dec 2007
Greg Smith
Analyst / Analytical Chemist

Product news

HORIBA Jobin Yvon is pleased to announce that it has reached an agreement with xk, Inc. to become the exclusive provider of SLICE software to the XRF community. SLICE, the Spectral Library Identification and Classification Explorer, is designed to archive, query, and compare x-ray spectra, and represents a revolutionary new approach to materials analysis.

It was developed under an FBI contract to save time and improve the accuracy of evidence identification, and to create an advanced archiving tool, allowing spectra, images, and text to be seamlessly linked.

Searching the database allows the spectra to be interrogated quickly and efficiently. It has become a widely-used tool within Forensic laboratories where virtually any material can be encountered, and its use is now being extended to contaminant analysis in a wide range of industries, including pharmaceutical, automotive, engine wear and semiconductor.

HORIBA Jobin Yvon’s XGT micro-XRF analysers are used across these fields, and in combination with SLICE offer the analyst a complete solution for materials identification.

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Atomic Absorption / Emission SpectroscopyAtomic absorption spectroscopy (AAS) and atomic emission spectroscopy (AES) — also called optical emission spectroscopy (OES) — are used to detect the elemental constituents in samples. Both techniques involve the atomization of a sample. Atomic absorption spectrometers may use a flame or furnace to create an atomic vapor of the sample before irradiation with spectral light. Optical emission spectrometers may use a flame, inductively coupled plasma (ICP), microwave plasma (MP) or spark arcs to atomize and excite the sample. At higher excitation energies, electrons can be emitted instead of photons, which can be useful for samples that can’t be atomized and for surface analysis. Explore electron spectroscopy equipment such as Auger spectrometers and photoelectron spectrometers for surface elemental analysis of samples. Find the best atomic absorption, photoelectron and optical emission spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.Data AnalysisData analysis hardware and software is available to make data processing straight-forward yet powerful. Data software can be used for math and stats, technical graphing and image analysis. In addition, software is available for specific data analysis of electrophoresis, densitometry, ELISA and DNA sequencing.Consultancy ServicesLaboratory consultancy services are available for automated systems design, research and development, lab equipment procurement and lab equipment rental.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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SLICE: A New XRF Methodology and Library for Sample Identification and Archiving