NewsLife Sciences
Shale and Solar Thin Film Cross Sectioning Demonstrated in New E-Brochure
7 May 2009Emily Marquez-Vega
Publishing / Media
Product news
A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples.
The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ideal for preparing difficult samples.
Please follow the company article webpage link on the right hand side of the screen to view the online brochure.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.