Rigaku to Present Latest X-Ray Analytical Instrumentation at 2019 European Crystallographic Meeting

Rigaku Oxford Diffraction will show latest technology at the 32nd European Crystallographic Meeting

30 Jul 2019
Georgina Wynne Hughes
Editorial Assistant

Industry news

Rigaku Corporation has announced its attendance at the 32nd European Crystallographic Meeting (ECM32). The conference will take place Sunday, August 18 to Friday, August 23, 2019 in Vienna, Austria.

The five-day conference will provide opportunities for crystallographers to meet and present the latest scientific developments, exchange ideas, and forge new collaborations. The event will include workshops, user meetings and a social program.

Rigaku will present X-ray diffraction (XRD) systems from Rigaku Oxford Diffraction. Designed to meet small molecule and protein crystallographic requirements, the systems are part of the diverse lines of X-ray analytical equipment from Rigaku, including the latest single crystal and powder crystallography systems.

As a global leader in analytical X-ray technology, Rigaku is also a key sponsor of the event. Information about X-ray-based solutions from Rigaku will be available at Booth # D09.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Crystallography