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Rigaku to host Virtual Analytical X-ray Convention

Rigaku Corporation

Rigaku will be live webcasting a 3-day Virtual Analytical X-ray Convention, taking place August 4-6, featuring live seminars on X-ray techniques and live instrument demonstrations.

21 Jul 2020
Tom Casburn
Associate Editor

Industry news

Rigaku Corporation, a global leader in X-ray analytical instrumentation, is pleased to present a 3-day Virtual Analytical X-ray Convention.

In response to the cancellations of the Microscopy & MicroAnalysis, Denver X-ray, and American Crystallographic Association physical conferences this summer due to the coronavirus (COVID-19) outbreak, Rigaku will present live webcasts of a 3-day Virtual Analytical X-ray Convention from the Rigaku laboratory facility in Texas. The webcasts will take place Tuesday, August 4 through Thursday, August 6, and will feature live seminars on X-ray techniques and live instrument demonstrations.

The event will feature virtual “booths” for X-ray diffraction (XRD), X-ray computed tomography (CT) and X-ray fluorescence (XRF). Participants can visit any booth at any time during the event to view the content, gather information or access the on-demand presentations. There will also be live webcasts and equipment demonstrations given at multiple times throughout the 3-day event, as well as a concierge booth where visitors can ask questions or schedule private demos or training sessions.

Live webcasts will cover a broad range of topics from practical applications, best practices, advanced methods, and the latest developments in X-ray based analytical technology.

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.X-Ray Source

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Rigaku to host Virtual Analytical X-ray Convention