Rigaku Presents Latest Crystallography Systems at the 69th American Crystallographic Association Meeting

Rigaku Oxford Diffraction is exhibitor and sponsor at the 2019 ACA Annual Meeting in Covington

22 Jul 2019
Georgina Wynne Hughes
Editorial Assistant

Industry news

Rigaku Oxford Diffraction has announced its attendance at the 69th Annual Meeting of the American Crystallographic Association (ACA), Saturday, July 20, through Wednesday, July 24, 2019 at the Northern Kentucky Convention Center in Covington, Kentucky. Rigaku Oxford Diffraction, a Ruby Sponsor of the event, is presenting their macromolecular and small molecule crystallography instrumentation at booths 206 and 208.

The American Crystallographic Association’s Annual Meeting is among the largest gatherings of crystallographers in the world. It features workshops, information sessions showcasing the latest research and developments in convergent structural science, along with one of the largest exhibit shows in the industry.

Joe Ferrara, Deputy Director, X-ray Research Laboratory, Rigaku Corporation and President of the ACA states that “We have an excellent scientific program including the Transactions Symposium on Data Best Practices, keynote lectures and workshops, as well as events geared toward career development for young scientists. This will be a hot meeting.”

On display at the event will be the Rigaku XtaLAB Synergy-DW dual wavelength X-ray diffractometer with a Hybrid Photon Counting (HPC) detector X-ray detector. The system is a versatile high-flux diffractometer, offering two wavelengths in one compact system for 3D chemical structure analysis. It is configured with a fast and efficient four-circle kappa goniometer that is compatible with a wide range of detectors.

Rigaku conducted a users’ meeting at 4 pm on Saturday and hosted a reception on Sunday evening from 7-9:30 PM. A poster session presenting two new scientific posters from Rigaku will take place on Tuesday, from 5:30 PM - 7:30 PM.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Crystallography
Rigaku Presents Latest Crystallography Systems at the 69th American Crystallographic Association Meeting