Rigaku Introduces the NEX QC+ High Resolution Benchtop EDXRF

15 Oct 2012

Product news

Applied Rigaku Technologies, Inc. today introduced a new low cost, high resolution benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+, at the 2012 Gulf Coast Conference (GCC) in Galveston, Texas. On exhibit at Booth #1004, the compact NEX QC+ delivers rapid quantitative determination of sodium (11Na) to uranium (92U) in solids, liquids, powders and alloys and is compliant with the ISO 13032 method for determination of ultra-low sulfur in diesel (ULSD).

Derived from the NEX QC elemental analyzer that was introduced in 2011, the NEX QC+ was likewise designed for routine quality control applications. The new instrument is differentiated by a high-resolution Peltier cooled Silicon Drift Detector (SDD) that, together with a 50kV X-ray tube, delivers exceptional short-term repeatability and long-term reproducibility with excellent elemental peak separation. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD). Like the NEX QC, it has an intuitive smartphone style touch screen interface for easy operation and a built-in printer for convenience.

A silicon drift detector (SDD) affords extremely high count rate capability with excellent spectral resolution. This enables the Rigaku NEX QC+ to deliver the highest precision analytical results in the shortest possible measurement times. The unique engineering feature of a SDD is the transversal electrical field generated by a series of ring electrodes that forces charge carriers to 'drift' to a small collection electrode. Current generation SDD detectors, with the field effect transistor (FET) moved out of the radiation path represent the current state-of-the-art in conventional EDXRF detector technology.

Options for the NEX QC+ include fundamental parameters, an automatic sample changer, a sample spinner and helium purge for enhanced light element sensitivity. Applications for the NEX QC span a broad spectrum of analytical needs and industries.

NEX QC+ EDXRF Analyzer

Rigaku Corporation

For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectro­meter. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).NEX QC+ Features: Analyze 11Na to 92U non-destructively Solids, liquids, alloys, powders and thin films 50kV X-ray tube for wide elemental coverage SDD detector for superior resolution and sensitivity Modern smartphone style "icon driven" user interface Multiple automated tube filters for enhanced sensitivity Convenient built in thermal printer Low cost with unmatched performance-to-price ratio Optional fundamental parameters

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Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SulfurSodiumUranium
Rigaku Introduces the NEX QC+ High Resolution Benchtop EDXRF