Rigaku introduces new dual-wavelength rotating anode X-ray diffractometer

Rigaku Oxford Diffraction debuts new XtaLAB Synergy-DW VHF dual-wavelength rotating anode single crystal X-ray diffractometer with HPC X-ray detector

21 May 2020
Georgina Wynne Hughes
Editorial Assistant

Product news

Rigaku Oxford Diffraction is pleased to report the release of a new dual-wavelength single crystal system, the Rigaku XtaLAB Synergy-DW VHF dual-wavelength high-flux, rotating anode X-ray diffractometer. The new instrument was first announced in the April edition of Crystallography Times, the electronic newsletter published by Rigaku focusing on single crystal X-ray diffraction.

The XtaLAB Synergy-DW VHF design is an extension of a revolutionary idea introduced in 2004 with the Oxford Diffraction Gemini diffractometer, with two independent X-ray sources. The groundbreaking design enabled crystallographers to easily switch between copper (Cu) and molybdenum (Mo) wavelengths, greatly expanding the experimental flexibility available for analyzing single crystal samples. The new system retains the flexibility of the dual-wavelength capability but also adds the exceptional flux enhancement of a reliable, rotating anode X-ray source.

The new system’s high-speed kappa goniometer, high-flux rotating anode X-ray source, fast, low-noise X-ray detector, and optimized instrument control software allow for faster, more precise data collection. The ability to investigate small samples is further improved by the increased flux from the rotating anode X-ray source as well as the extreme low noise of the Rigaku HyPix X-ray detectors.

The XtaLAB Synergy-DW VHF diffractometer provides 50% more flux at the sample position over the previous DW model due to newly designed confocal optics. The ability to configure it with two different wavelengths means that with a Cu/Mo anode the XtaLAB Synergy-DW VHF instrument can be shared between structural biology and chemical crystallography groups. The system is positioned to be a no-compromise solution, to allow the sharing of resources when needed, for both protein and small molecule crystallographers.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Crystallography
Rigaku introduces new dual-wavelength rotating anode X-ray diffractometer