Rigaku Introduces New Central Software Platform that Simplifies X-Ray Analysis

22 Jul 2013

Product news

Rigaku Corporation is pleased to announce a new software product, SmartStudio™, which acts as a centralized command center for operating Rigaku’s top of the line SmartLab X-ray diffractometer, as well as carrying out all of the post-measurement analysis calculations from a centralized user interface.

SmartStudio is a platform that seamlessly integrates the software modules that operate the SmartLab diffractometer as well as analyze data generated by the SmartLab. It enhances the communication between the application software modules and increases ease of use. Data generated from one application module can be sent to another software module with a single mouse click using the Launcher, an interface that serves as the starting point for application software modules. When the user selects a data file, the applications available for launch will be displayed. Various processes from measurement to analysis are automatically executed by use of a recipe function. Using SmartStudio as the central point of all data measurement and analysis allows for a much more efficient workflow and fewer possibilities for errors.

The data acquisition module, Guidance, is unique in the field of X-ray diffraction in that the user only has to select the type of measurement to be made. The software then suggests the hardware configuration to be installed, checks that the proper configuration is actually installed, sets data acquisition parameters, performs an automatic instrument alignment, aligns the sample, makes a preliminary measurement to fine-tune the data measurement settings and then makes the measurement. This powerful software module is invaluable for new users and as acts as an error prevention system for experienced users.

For data analysis, Smart Studio supports a multitude of modules for powder diffraction and thin film analysis. The Smart Studio command center makes it easy for a user to move among the various analysis modules, saving time and reducing errors.

SmartLab

Rigaku Corporation

The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side. The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.SmartLab Features: Full automated alignment under computer control. Optional in-plane diffraction arm for in-plane measurements without reconfiguration. Focusing and parallel beam geometries without reconfiguration. SAXS capabilities.

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Data AnalysisData analysis hardware and software is available to make data processing straight-forward yet powerful. Data software can be used for math and stats, technical graphing and image analysis. In addition, software is available for specific data analysis of electrophoresis, densitometry, ELISA and DNA sequencing.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Data AcquisitionData acquisition refers to the collection and organization of information and data sets.
Rigaku Introduces New Central Software Platform that Simplifies X-Ray Analysis