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Probing nanoscale structure & properties of polymers: advances in atomic force microscopy

SelectScience

Join this expert webinar to learn about advances in atomic force microscopy

29 Sept 2019
Laura Sisman
Administrator / Office Personnel

Expert insights

An upcoming SelectScience webinar will highlight advances in atomic force microscopy and how it can reveal polymer nanostructures.

Today’s characterization tools must provide critical information at ever-finer length scales, down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely positioned to do this job.

Join applications scientist Dr. Ted Limpoco and AFM applications scientist Dr. Jonathan Moffat as they look at how AFMs can reveal polymer structures down to the crystal lamellae, examine morphologies such as nanopores and nanofibers created from specific processes, and evaluate the dispersion of fillers and phase separation of components in composites and blends.

REGISTER NOW

In this webinar, you will discover cutting-edge engineering to create high-level polymer products.

Plus, learn how to:

  • Use your skills towards innovating high-performance polymer products
  • Help shape the future of the polymer industry by helping to shape the way products are made
  • Apply the latest material and process innovations and reduce time to market


The live webinar takes place on Wednesday, October 16, 2019, at:

  • 16:00 BST
  • 11:00 EDT
  • 08:00 PDT
  • 17:00 CEST


Who should attend?

  • In the polymer industry, formulation and process engineers, as well as those involved in failure analysis, should attend.
  • In academia, professors, postdocs, and graduate students whose research includes polymer materials are encouraged to attend.


Certificate of attendance
All webinar participants can request a certificate of attendance, and a learning outcomes summary document for continuing education purposes.

Scheduling conflict? No matter, register to receive an on-demand link to watch later>>

Links

SelectScienceCompany website

Tags

Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.PolymersPolymers are large molecules made up of many repeat units. Natural polymers such as DNA and proteins are essential to life, whereas synthetic polymers such as polystyrene and polyethylene are used widely due to their functionality. Typical techniques for analysis include GPC, SEC, DSC, FT-IR and NMR.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.AFMNanostructures

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Probing nanoscale structure & properties of polymers: advances in atomic force microscopy