Photo Back Illuminated 16 Channel Photodiode Array Introduced

28 Jun 2012

Product news

Hamamatsu Photonics have introduced a brand new back illuminated 16 channel photodiode array (PDA), designed for use in X-ray non-destructive testing applications. The S11299 uses flip-chip technology that allows the PDA to receive scintillation light from the back side of the array. This flip-chip approach reduces the need for gold bond wires and junction layers on the light input side, vastly reducing the risk of wire bond damage during scintillator mounting.

The S11299 uses a new slender board design, with a vertical height of just 10.2mm. This allows for long and narrow arrays to be constructed. Additionally, the S11299 is suitable for dual energy imaging, by combining two arrays with differing scintillator thicknesses in a vertical structure. The existing S11212 series is ideal for this and various configurations can be designed to match any application requirement.

The S11299 series shows a large improvement in uniformity compared to the popular conventional S5668 array that has been in production for many years. The new design also makes the new series highly reliable, by reducing the risk of bond wire damage.

This new series of PDAs is set to make a large improvement to X-ray non-destructive testing and security applications especially baggage scanning.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.ScintillationScintillation is an analytical technique used to measure the ionizing radiation of an analyte. At the core of a scintillation counter is a sensor and detector, where the sensor is typically a scintillator crystal. Scintillation also includes liquid scintillation, radiometers and particle counters. Key features of scintillator counters include high resolution, automated multi-detection and high counting efficiency.
Photo Back Illuminated 16 Channel Photodiode Array Introduced