PANalytical Launches New XRF Analysis Software

26 Mar 2013

Product news

PANalytical, the world's leading supplier of analytical X-ray equipment and software, is set to launch its new software for X-ray fluorescence (XRF) systems. PANalytical developed Stratos, a brand new software package, for both the Epsilon 3 and Axios spectrometer ranges. The company will also be releasing an upgrade of the FingerPrint software for the Epsilon 3 range.

Stratos – sophisticated analysis made easy
The Stratos XRF analysis software features built-in intelligence and can quickly and accurately analyze the thickness and composition of coatings, surface layers and layered structures. Multi-layer samples can be analyzed with bulk standards, without the need for in-type standards that are sometimes hard to source. Another significant advantage of the software is its flexibility and the ease of use provided by the 'Virtual Analyst'. This unique tool is a consultant for advanced method development and provides optimum measurement settings for analysis, which can be time-consuming for complex stack structures. Stratos is able to analyze more than 16 layers, depending on their thickness and composition. It is also easily combined with PANalytical’s Omnian semi-quantitative software.

The Stratos software developed by PANalytical makes daily operation easier, with a simple interface that helps new users. Stratos is available for both the Epsilon 3 range (energy dispersive, EDXRF) and the Axios range (wavelength dispersive, WDXRF). Applications of Stratos include the automotive industry, wafers and solar cells and the coating and packaging industry.

FingerPrint software upgrade for more convenience
FingerPrint software is the second generation of PANalytical’s successful material identification software for the benchtop Epsilon 3 range of spectrometers. The unique combination of FingerPrint software with Epsilon 3 sets new standards for industrial and process control applications. The upgraded FingerPrint software makes it even easier for material testing where the actual composition is not of interest and analysis speed is important. The addition of simple pass/fail reporting means that expert knowledge is no longer required to interpret the results and application of PCA (principal components analysis) allows cluster analysis in 3D visualization. FingerPrint software is used in materials identification, comparison and quality control and can be used in a wide range of applications, for example in the pharmaceutical, cosmetic, food and petrochemical industries.

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Data AnalysisData analysis hardware and software is available to make data processing straight-forward yet powerful. Data software can be used for math and stats, technical graphing and image analysis. In addition, software is available for specific data analysis of electrophoresis, densitometry, ELISA and DNA sequencing.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.
PANalytical Launches New XRF Analysis Software